Laser interferometers are the most precise gauges for position and geometry measurements. They provide higher accuracy and resolution and can measure longer distances than alternative measuring devices or scales. At the same time they are also much more universal. A wavelength-stabilized laser is used as the length standard in the LOS system.
CCD camera measuring devices make the measurement very flexible, fast and accurate.
Combination of the laser interferometer with the CCD camera measuring system provides a new high performance measuring and calibrating system for a wide range of applications.

	PC controlled modular system
	Extensive Windows software
	Simultaneous straightness and position measurement
	Resolution 1 nm at velocity up to 2 m/s
	Sampling up to 500 kHz
	Synchronous measurement in up to 3 axes
	Easy system operation
	High productivity at practical use
	Optical alignment simplified by software support
	Automatic environmental compensation of measured values
	Immediate readiness for measurement
	Automatic compensation of machine tool control system
	Hardware and Software modifications according to customer requirements
	Small dimensions
	Certified laser wavelength
	Reliable in workshop conditions
	Safe laser radiation
	Short delivery terms
	3 years warranty

Position
Velocity
Acceleration
Straightness
Squareness
Angles
Flatness
Parallelism

	Machinery
	Machine tool calibration and compensation Calibration of CMMs Calibration of measuring devices Production quality control Measurement of dimensions Adjustment and alignment of machines and devices Maintenance of machines Internal measurement system for high-accuracy machines Lead screw verification Dynamic measurement
	Aircraft and automobile industry
	Measurement and checking of large dimensions
	Metrology and calibration institutes
	The system is used in various applications as a length standard
	Research and developmentj
	Technical universities
	Microelectronic industry
	The internal multiaxis system for high precision positioning mechanisms with both open and closed control loop, e.g. - step and repeat cameras - testing of semiconductor wafers - laser writing machines
	Other applications
	Used in various branches where the accurate measurement of position and geometry is required.

At dynamic measurement the LOS system samples the measured value. The samples are buffered. The maximum sampling frequency is 500 kHz. The samples are processed after the measurement has ended and can be displayed and printed in the desired format. The WinScope software package analyses the measured values and provides you with a wide range of functions (mode of triggering, mathematic and statistical functions, FFT, spectrum analysis, powerful graphics).

Wavelength certificates are issued for LOS system lasers. This enables the lasers to be used as factory length etalons and to document the production quality control which is important for ISO 9000 certification.